-
Neelesh Bhattacharya,
Olfat El Mahi,
Etienne Duclos,
Giovanni Beltrame,
Giuliano Antoniol,
Sébastien Le Digabel,
and Yann-Gaël Guéhéneuc.
Optimizing Threads Schedule Alignments to Expose the Interference Bug Pattern.
In Gordon Fraser and Jerffeson Teixeira de Souza, editors,
Proceedings of the 4th Symposium on Search Based Software Engineering (SSBSE),
pages 90--104,
September 2012.
IEEE CS Press.
Note: 15 pages. [Text
] [Slides
] Keyword(s): Topic: Test case generation,
Venue: SSBSE.
-
Abdou Maiga,
Nasir Ali,
Neelesh Bhattacharya,
Aminata Sabané,
Yann-Gaël Guéhéneuc,
Giuliano Antoniol,
and Esma Aimeur.
SMURF: A SVM-based Incremental Anti-pattern Detection Approach.
In Rocco Oliveto and Denys Poshyvanyk, editors,
Proceedings of the 19th Working Conference on Reverse Engineering (WCRE),
pages 466--475,
October 2012.
IEEE CS Press.
Note: 10 pages. [Text
] [Slides
] Keyword(s): Topic: Code and design smells,
Venue: WCRE.
-
Abddou Maiga,
Nasir Ali,
Neelesh Bhattacharya,
Aminata Sabané,
Yann-Gaël Guéhéneuc,
Giuliano Antoniol,
and Esma Aimeur.
Support Vector Machines for Anti-pattern Detection.
In Tim Menzies and Motoshi Saeki, editors,
Proceedings of the 27th Conference on Automated Software Engineering (ASE),
pages 278--281,
September 2012.
ACM Press.
Note: Short paper. 4 pages. [Text
] [Slides
] Keyword(s): Topic: Code and design smells,
Venue: ASE.
-
Neelesh Bhattacharya,
Abdelilah Sakti,
Giuliano Antoniol,
Yann-Gaël Guéhéneuc,
and Gilles Pesant.
Divide-by-zero Exceptions Raising via Branch Coverage.
In Myra Cohen and Mel Ó Cinnéide, editors,
Proceedings of the 3rd International Symposium on Search-based Software Engineering (SSBSE),
pages 204--218,
September 2011.
IEEE CS Press.
Note: 10 pages. [Text
] [Slides
] Keyword(s): Topic: Test case generation,
Venue: SSBSE.
-
Neelesh Bhattacharya,
Abdelilah Sakti,
Giuliano Antoniol,
Yann-Gaël Guéhéneuc,
and Gilles Pesant.
Performance Analysis of Metaheuristic and Constraint Programming Approaches to Generate Structural Test Cases.
In Fevzi Belli and Michael Linschulte, editors,
Proceedings of the 4th International Conference on Software Testing, Verification, and Validation (ICST),
pages N/A,
March 2011.
IEEE CS Press.
Note: Poster. 2 pages. [Text
] [Slides
] Keyword(s): Topic: Test case generation,
Venue: ICST.
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