-
Jane Huffman Hayes,
Giuliano Antoniol,
Bram Adams,
and Yann-Gaël Guéhéneuc.
Inherent Characteristics of Traceability Artifacts: Less Is More.
In Didar Zowghi and Vincenzo Gervasi, editors,
Proceedings of the 23rd International Requirements Engineering Conference (RE),
pages 196--201,
August 2015.
IEEE CS Press.
Note: 6 pages. RE Next!.
[Text
] [Slides
] Keyword(s): Topic: Program comprehension,
Venue: RE.
-
Jane Huffman Hayes,
Yann-Gaël Guéhéneuc,
Giuliano Antoniol,
Wenbin Li,
and Mirek Truszczynski.
Error Leakage and Wasted Time: Sensitivity Analysis of a Requirements Consistency Checking Process.
In Marouane Kessentini, editor,
Proceedings of the 1st North American Search Based Software Engineering Symposium (NasBASE),
pages 1061--1080,
February 2015.
Elsevier.
Note: 15 pages. [Text
] [Slides
] Keyword(s): Topic: Requirements and features,
Venue: NasBASE.
-
Nasir Ali,
Wei Wu,
Giuliano Antoniol,
Massimiliano Di Penta,
Yann-Gaël Guéhéneuc,
and Jane Huffman Hayes.
MoMS: Multi-objective Miniaturization of Software.
In James R. Cordy and Paolo Tonella, editors,
Proceedings of the 27th International Conference on Software Maintenance (ICSM),
pages 153--162,
September 2011.
IEEE CS Press.
Note: 10 pages. [Text
] [Slides
] Keyword(s): Topic: Requirements and features,
Venue: ICSM,
Venue: ICSME.
-
Giuliano Antoniol,
Jane Huffman Hayes,
Yann-Gaël Guéhéneuc,
and Massimiliano Di Penta.
Reuse or Rewrite: Combining Textual, Static, and Dynamic Analyses to Assess the Cost of Keeping a System Up-to-date.
In Hong Mei and Kenny Wong, editors,
Proceedings of the 24th International Conference on Software Maintenance (ICSM),
pages 147--156,
September--October 2008.
IEEE CS Press.
Note: 10 pages. [Text
] [Slides
] Keyword(s): Topic: Requirements and features,
Venue: ICSM,
Venue: ICSME.
-
Jane Huffman Hayes,
Giuliano Antoniol,
and Yann-Gaël Guéhéneuc.
Prereqir: Recovering Pre-Requirements via Cluster Analysis.
In Andy Zaidman,
Massimilano Di Penta,
and Ahmed Hassan, editors,
Proceedings of the 15th Working Conference on Reverse Engineering (WCRE),
pages 165--174,
October 2008.
IEEE CS Press.
Note: 10 pages. [Text
] [Slides
] Keyword(s): Topic: Requirements and features,
Venue: WCRE.
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