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Weitao Pan,
Hironori Washizaki,
Nobukazu Yoshioka,
Yoshiaki Fukazawa,
Foutse Khomh,
and Yann-Gaël Guéhéneuc.
A Machine Learning Based Approach to Detect Machine Learning Design Patterns.
In Joo-yong Yi and Gary T. Leavens, editors,
Proceedings of the 30th Asia-Pacific Software Engineering Conference (APSEC),
pages 574--578,
December 2023.
IEEE CS Press.
Note: 5 pages. Early Research Achievements Track. [Text
] [Slides
] Keyword(s): Topic: Design patterns,
Venue: APSEC.
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