-
Devansh Tiwari,
Hironori Washizaki,
Yoshiaki Fukazawa,
Tomoyuki Fukuoka,
Junji Tamaki,
Nobuhiro Hosotani,
Munetaka Kohama,
Yann-Gaël Guéhéneuc,
and Foutse Khomh.
Commit-Defect and Architectural Metrics-based Quality Assessment of C language.
In Raian Ali,
Hermann Kaindl,
and Leszek A. Maciaszek, editors,
Proceedings of the 15th International Conference on Evaluation of Novel Approaches to Software Engineering (ENASE),
pages 579--586,
May 2020.
SciTePress.
Note: 8 pages. [Text
] [Slides
] Keyword(s): Quality models,
ENASE.
-
Hironori Washizaki,
Foutse Khomh,
and Yann-Gaël Guéhéneuc.
Software Engineering Patterns for Machine Learning Applications (SEP4MLA).
In Yung-Pin Cheng,
Takashi Iba,
and Wen-Chun Ni, editors,
Proceedings of the 9th Asian Conference on Pattern Languages of Programs (AsianPLoP),
September 2020.
ACM Press.
Note: 10 pages. [Text
] Keyword(s): Design patterns,
PLoP.
-
Hironori Washizaki,
Foutse Khomh,
Yann-Gaël Guéhéneuc,
Hironori Takeuchi,
Satoshi Okuda,
Naotake Natori,
and Naohisa Shioura.
Software Engineering Patterns for Machine Learning Applications (SEP4MLA) - Part 2.
In Rebecca Wirfs-Brock, editor,
Proceedings of the 27th Conference on Pattern Languages Of Programs (PLoP),
October 2020.
ACM Press.
Note: 10 pages. [Text
] Keyword(s): Design patterns,
PLoP.
-
Hironori Washizaki,
Hiromu Uchida,
Foutse Khomh,
and Yann-Gaël Guéhéneuc.
Studying Software Engineering Patterns for Designing Machine Learning Systems.
In Akinori Ihara and Marco Aurélio Gerosa, editors,
Proceedings of the 10th International Workshop on Empirical Software Engineering in Practice (IWESEP),
pages 49--54,
December 2019.
IEEE CS Society.
Note: 6 pages. [Text
] [Slides
] Keyword(s): Code and design smells,
IWESEP.
-
Hironori Washizaki,
Yann-Gaël Guéhéneuc,
and Foutse Khomh.
A Taxonomy for Program Metamodels in Program Reverse Engineering.
In Bram Adams and Denys Poshyvanyk, editors,
Proceedings of the 32nd International Conference on Software Maintenance and Evolution (ICSME),
pages 44--55,
October 2016.
IEEE CS Press.
Note: 10 pages. [Text
] [Slides
] Keyword(s): Design patterns,
ICSM,
ICSME.
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