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Jane Huffman Hayes,
Giuliano Antoniol,
Bram Adams,
and Yann-Gaël Guéhéneuc.
Inherent Characteristics of Traceability Artifacts: Less Is More.
In Didar Zowghi and Vincenzo Gervasi, editors,
Proceedings of the 23rd International Requirements Engineering Conference (RE),
pages 196--201,
August 2015.
IEEE CS Press.
Note: RE Next! 6 pages. [Text
] [Slides
] Keyword(s): Topic: Program comprehension,
Venue: RE.
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