Venue: RE 
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Conference articles
  1. Jane Huffman Hayes, Giuliano Antoniol, Bram Adams, and Yann-Gaël Guéhéneuc. Inherent Characteristics of Traceability Artifacts: Less Is More. In Didar Zowghi and Vincenzo Gervasi, editors, Proceedings of the 23rd International Requirements Engineering Conference (RE), pages 196--201, August 2015. IEEE CS Press. Note: RE Next! 6 pages. [Text ] [Slides ] Keyword(s): Topic: Program comprehension, Venue: RE.