Venue: WCRE 
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Conference articles
  1. Gabriele Bavota, Rocco Oliveto, Andrea De Lucia, Andrian Marcus, Yann-Gaël Guéhéneuc, and Giuliano Antoniol. In Medio Stat Virtus: Extract Class Refactoring through Nash Equilibria. In Dave Binkley and Filippo Ricca, editors, Proceedings of the 1st CSMR-WCRE Software Evolution Week (CSMR-WCRE), pages 214--223, February 2014. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Code and design smells, Venue: CSMR-WCRE, Venue: CSMR, Venue: WCRE.

  2. Fehmi Jaafar, Yann-Gaël Guéhéneuc, Sylvie Hamel, and Foutse Khomh. Mining the Relationship Between Anti-patterns Dependencies and Fault-proneness. In Rocco Oliveto and Romain Robbes, editors, Proceedings of the 20th Working Conference on Reverse Engineering (WCRE), October 2013. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Code and design smells, Venue: WCRE.

  3. Zéphyrin Soh, Foutse Khomh, Yann-Gaël Guéhéneuc, and Giuliano Antoniol. Towards Understanding How Developers Spend Their Effort During Maintenance Activities. In Rocco Oliveto and Romain Robbes, editors, Proceedings of the 20th Working Conference on Reverse Engineering (WCRE), pages 152--161, October 2013. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Program comprehension, Venue: WCRE.

  4. Zéphyrin Soh, Foutse Khomh, Yann-Gaël Guéhéneuc, Giuliano Antoniol, and Bram Adams. On the Effect of Program Exploration on Maintenance Tasks. In Rocco Oliveto and Romain Robbes, editors, Proceedings of the 20th Working Conference on Reverse Engineering (WCRE), pages 391--400, October 2013. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Program comprehension, Venue: WCRE.

  5. Surafel Lemma Abebe, Paolo Tonella, Venera Arnaoudova, Giuliano Antoniol, and Yann-Gaël Guéhéneuc. Can Lexicon Bad Smells Improve Fault Prediction?. In Rocco Oliveto and Denys Poshyvanyk, editors, Proceedings of the 19th Working Conference on Reverse Engineering (WCRE), pages 235--244, October 2012. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Code and design smells, Venue: WCRE.

  6. Latifa Guerrouj, Philippe Galinier, Yann-Gaël Guéhéneuc, Giuliano Antoniol, and Massimiliano Di Penta. TRIS: a Fast and Accurate Identifiers Splitting and Expansion Algorithm. In Rocco Oliveto and Denys Poshyvanyk, editors, Proceedings of the 19th Working Conference on Reverse Engineering (WCRE), pages 103--112, October 2012. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Identifier analysis, Venue: WCRE.

  7. Abdou Maiga, Nasir Ali, Neelesh Bhattacharya, Aminata Sabané, Yann-Gaël Guéhéneuc, Giuliano Antoniol, and Esma Aimeur. SMURF: A SVM-based Incremental Anti-pattern Detection Approach. In Rocco Oliveto and Denys Poshyvanyk, editors, Proceedings of the 19th Working Conference on Reverse Engineering (WCRE), pages 466--475, October 2012. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Code and design smells, Venue: WCRE.

  8. Soumaya Medini, Giuliano Antoniol, Yann-Gaël Guéhéneuc, Massimiliano Di Penta, and Paolo Tonella. SCAN: an Approach to Label and Relate Execution Trace Segments. In Rocco Oliveto and Denys Poshyvanyk, editors, Proceedings of the 19th Working Conference on Reverse Engineering (WCRE), pages 135--144, October 2012. IEEE CS Press. Note: Best paper. 10 pages. [Text ] [Slides ] Keyword(s): Topic: Requirements and features, Venue: WCRE.

  9. Nasir Ali, Yann-Gaël Guéhéneuc, and Giuliano Antoniol. Requirements Traceability for Object Oriented Systems by Partitioning Source Code. In Martin Pinzger and Denys Poshyvanyk, editors, Proceedings of the 18th Working Conference on Reverse Engineering (WCRE), pages 45--54, October 2011. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Requirements and features, Venue: WCRE.

  10. Fehmi Jaafar, Yann-Gaël Guéhéneuc, Sylvie Hamel, and Giuliano Antoniol. An Exploratory Study of Macro Co-changes. In Martin Pinzger and Denys Poshyvanyk, editors, Proceedings of the 18th Working Conference on Reverse Engineering (WCRE), pages 325--334, October 2011. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Evolution patterns, Venue: WCRE.

  11. Foutse Khomh, Massimiliano Di Penta, and Yann-Gaël Guéhéneuc. An Exploratory Study of the Impact of Code Smells on Software Change-proneness. In Giuliano Antoniol and Andy Zaidman, editors, Proceedings of the 16th Working Conference on Reverse Engineering (WCRE), pages 75--84, October 2009. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Code and design smells, Venue: WCRE.

  12. Stéphane Vaucher, Foutse Khomh, Naouel Moha, and Yann-Gaël Guéhéneuc. Tracking Design Smells: Lessons from a Study of God Classes. In Giuliano Antoniol and Andy Zaidman, editors, Proceedings of the 16th Working Conference on Reverse Engineering (WCRE), pages 145--154, October 2009. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Code and design smells, Topic: Quality models, Venue: WCRE.

  13. Jane Huffman Hayes, Giuliano Antoniol, and Yann-Gaël Guéhéneuc. Prereqir: Recovering Pre-Requirements via Cluster Analysis. In Andy Zaidman, Massimilano Di Penta, and Ahmed Hassan, editors, Proceedings of the 15th Working Conference on Reverse Engineering (WCRE), pages 165--174, October 2008. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Requirements and features, Venue: WCRE.

  14. Salah Bouktif, Yann-Gaël Guéhéneuc, and Giuliano Antoniol. Extracting Change-patterns from CVS Repositories. In Susan Elliott Sim and Massimiliano Di Penta, editors, Proceedings of the 13th Working Conference on Reverse Engineering (WCRE), pages 221--230, October 2006. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Evolution patterns, Venue: WCRE.

  15. Yann-Gaël Guéhéneuc, Houari Sahraoui, and Farouk Zaidi. Fingerprinting Design Patterns. In Eleni Stroulia and Andrea de Lucia, editors, Proceedings of the 11th Working Conference on Reverse Engineering (WCRE), pages 172--181, November 2004. IEEE CS Press. Note: 10 pages. [Text ] [Slides ] Keyword(s): Topic: Design patterns, Venue: WCRE.